For Authors:

Manuscript submissions

Submitted papers must not have been published elsewhere and must not be currently under review by another conference or journal. Authors are invited to submit double-column full (up to 8 pages) and short papers (up to 4 pages) as a PDF file in IEEE format with a font size no smaller than 10pt. Short papers should present future research directions and ongoing work with visionary, innovative ideas; accepted short papers and posters will be included in the conference proceedings. Submission implies the willingness of at least one of the authors to register and present the paper. Conference proceedings will be included in the IEEE Xplore library.

Papers (including those destined to special sessions) must be submitted through the EDAS system. The following link will bring you directly to WONS 2012 paper registration page.

IEEE/IFIP WONS 2012 features Best Paper Award to award authors with superior quality paper submission to the conference. The award includes a framed certificate. The authors of Best Paper Award will be recognized in the conference.

IEEE and IEEE Communications Society Policies

Papers are reviewed on the basis that they do not contain plagiarized material and have not been submitted to any other conference at the same time (double submission). These matters are taken very seriously and the IEEE Communications society will take action against any author who has engaged in either practice.

IEEE Web Page on Plagiarism:

IEEE Web Page on Double Submission:

PLEASE NOTE: To be published in the IEEE WONS 2012 Conference Proceedings and IEEE Xplore®, at least one author of an accepted paper is required to register for the conference and must present the paper at the conference. Non-refundable registration fees must be paid prior to uploading the final IEEE formatted, publication-ready version of the paper. For authors with multiple accepted papers, a 200 euros fee is required for each additional paper. Accepted and presented papers will be published in the IEEE WONS 2012 Conference Proceedings and in IEEE Xplore®.